𝔖 Bobbio Scriptorium
✦   LIBER   ✦

D.C. scanning thermal microscopy: Characterisation and interpretation of the measurement

✍ Scribed by Séverine Gomes; Nathalie Trannoy; Philippe Grossel; Françoise Depasse; Claudine Bainier; Daniel Charraut

Book ID
108489262
Publisher
Elsevier Science
Year
2001
Tongue
French
Weight
253 KB
Volume
40
Category
Article
ISSN
1290-0729

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Characterisation of rough silicon surfac
Characterisation of rough silicon surfaces using spectroscopic ellipsometry, reflectance, scanning electron microscopy and scattering measurements
✍ C. Pickering; R. Greef; A.M. Hodge 📂 Article 📅 1990 🏛 Elsevier Science 🌐 English ⚖ 423 KB

A critical comparison of several techniques for the evaluation of imperfections in sificon-onsapphire (SOS) wafers leads to the adoption of a model of the SOS surface based on an effective medium approximation treatment of the ellipsometric" results.