𝔖 Bobbio Scriptorium

✦ LIBER ✦

DC Ionization Conductivity of Amorphous Semiconductors for Radiation Detection Applications

✍ Scribed by Johnson, Bradley R.; Crum, Jarrod V.; Sundaram, S. K.; Van Ginhoven, Renee M.; Seifert, Carolyn E.; Riley, Brian J.; Ryan, Joseph V.

Book ID: 125540316
Publisher: IEEE
Year: 2009
Tongue: English
Weight: 289 KB
Volume: 56
Category: Article
ISSN: 0018-9499
DOI: 10.1109/TNS.2009.2013344

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Amorphous chalcogenide semiconductors fo

Amorphous chalcogenide semiconductors for dosimetry of high-energy ionizing radiation

✍ O.I. Shpotyuk 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 284 KB

Experimental determination of the limits

Experimental determination of the limits and conditions of applicability of pairwise aggregation of radiometric instruments for the detection of sources of ionizing radiation

✍ V. T. Minligareev; A. V. Yashin; D. P. Bachurin 📂 Article 📅 2011 🏛 Springer US 🌐 English ⚖ 193 KB

[IEEE 2009 International Semiconductor D

[IEEE 2009 International Semiconductor Device Research Symposium (ISDRS 2009) - College Park, MD (2009.12.9-2009.12.11)] 2009 International Semiconductor Device Research Symposium - Plasma transport in graphene conduction channels and application for the detection of Terahertz signals

✍ Rudin, S. 📂 Article 📅 2009 🏛 IEEE ⚖ 148 KB

Nanoparticles in Biology and Medicine Vo

Nanoparticles in Biology and Medicine Volume 29a || The Application of Semiconductor Quantum Dots for Enhancing Peptide Desorption, Improving Peak Resolution and Sensitivity of Detection in Matrix-Assisted Laser Desorption/Ionization (MALDI) Mass Spectrometry

✍ Soloviev, Mikhail 📂 Article 📅 2012 🏛 Humana Press ⚖ 260 KB

[IEEE RADECS 93. Second European Confere

[IEEE RADECS 93. Second European Conference on Radiation and its Effects on Components and Systems (Cat. No.93TH0616-3) - St. Malo, France (13-16 Sept. 1993)] RADECS 93. Second European Conference on Radiation and its Effects on Components and Systems (Cat. No.93TH0616-3) - Low-frequency noise and DC characterization of ionization damage in a 1-μm SOI CMOS technology adapted for space applications

✍ Simoen, E.; Magnusson, U.; Van den bosch, G.; Smeys, P.; Colinge, J.P.; Claeys, 📂 Article 📅 1994 🏛 IEEE ⚖ 642 KB