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DC and AC measurements on metal/a-Si:H/metal thin film devices

✍ Scribed by J. Hajto; A.J. Snell; J. Hu; A. Holmes; A.E. Owen; M.J. Rose; R.A.G. Gibson


Book ID
115989255
Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
265 KB
Volume
164-166
Category
Article
ISSN
0022-3093

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