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D.c. and a.c. current crowding effects model analysis in bipolar junction transistors using a new extraction method

✍ Scribed by Heung-Soo Rhee; Seonghearn Lee; Bong-Ryul Kim

Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 429 KB
Volume: 38
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(94)e0062-j

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