DC and AC characteristics of sub-50-nm MOSFETs with source/drain-to-gate nonoverlapped structure

✍ Scribed by Hyunjin Lee, ; Jongho Lee, ; Hyungcheol Shin,

• Book ID: 120639933
• Publisher: IEEE
• Year: 2002
• Tongue: English
• Weight: 775 KB
• Volume: 1
• Category: Article
• ISSN: 1536-125X
• DOI: 10.1109/TNANO.2002.807376