Damaging process of α-SiC under electron irradiation studied with electron microscopy and spectroscopy
✍ Scribed by S. Muto; T. Tanabe; T. Shibayama; H. Takahashi
- Book ID
- 114165744
- Publisher
- Elsevier Science
- Year
- 2002
- Tongue
- English
- Weight
- 214 KB
- Volume
- 191
- Category
- Article
- ISSN
- 0168-583X
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