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Damage-induced surface effects in silicon detectors

✍ Scribed by R. Wunstorf; H. Feick; E. Fretwurst; G. Lindström; G. Lutz; C. Osius; R.H. Richter; T. Rohe; A. Rolf; P. Schlichthärle

No coin nor oath required. For personal study only.

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