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Temperature effects on radiation damage to silicon detectors

✍ Scribed by E. Barberis; J.G. Boissevain; N. Cartiglia; J.A. Ellison; P. Ferguson; J.K. Fleming; K. Holzscheiter; S. Jerger; D. Joyce; J.S. Kapustinsky; J. Leslie; C. Lietzke; J.A.J. Matthews; A.P.T. Palounek; D. Pitzl; W.A. Rowe; H.F.-W. Sadrozinski; D. Skinner; W.F. Sommer; W.E. Sondheim; S.J. Wimpenny; H.J. Ziock

Publisher: Elsevier Science
Year: 1993
Tongue: English
Weight: 486 KB
Volume: 326
Category: Article
ISSN: 0168-9002
DOI: 10.1016/0168-9002(93)90379-v

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