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Damage in semiconductor materials during heavy-ion elastic recoil detection analysis

✍ Scribed by S.R. Walker; P.N. Johnston; I.F. Bubb; W.B. Stannard; D.N. Jamieson; S.P. Dooley; D.D. Cohen; N. Dytlewski; J.W. Martin

No coin nor oath required. For personal study only.

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