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Damage coefficient in high-temperature particle- and γ-irradiated silicon p–i–n diodes

✍ Scribed by Ohyama, H.; Takakura, K.; Hayama, K.; Kuboyama, Satoshi; Deguchi, Yasushi; Matsuda, Sumio; Simoen, E.; Claeys, C.


Book ID
121674380
Publisher
American Institute of Physics
Year
2003
Tongue
English
Weight
304 KB
Volume
82
Category
Article
ISSN
0003-6951

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