C–V, DLTS and conductance transient characterization of SiNx:H/InP interface improved by N2remote plasma cleaning of the InP surface

✍ Scribed by H. Castán; S. Dueñas; J. Barbolla; E. Redondo; I. Mártil; G. González-Díaz

• Book ID: 110298640
• Publisher: Springer US
• Year: 2001
• Tongue: English
• Weight: 665 KB
• Volume: 12
• Category: Article
• ISSN: 0957-4522
• DOI: 10.1023/a:1011219622378