Customizing completely specified pattern set targeting dynamic and leakage power reduction during testing

✍ Scribed by S. Krishna Kumar; Subhadip Kundu; Santanu Chattopadhyay

• Book ID: 113951166
• Publisher: Elsevier Science
• Year: 2012
• Tongue: English
• Weight: 441 KB
• Volume: 45
• Category: Article
• ISSN: 0167-9260
• DOI: 10.1016/j.vlsi.2011.08.001