✦ LIBER ✦
DFT and Minimum Leakage Pattern Generation for Static Power Reduction During Test and Burn-In
✍ Scribed by Wei-Chung Kao; Wei-Shun Chuang; Hsiu-Ting Lin; Li, J.C.-M.; Manquinho, V.
- Book ID
- 118159763
- Publisher
- IEEE
- Year
- 2010
- Tongue
- English
- Weight
- 672 KB
- Volume
- 18
- Category
- Article
- ISSN
- 1063-8210
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