Current status and future trends of SiGe BiCMOS technology

✍ Scribed by Harame, D.L.; Ahlgren, D.C.; Coolbaugh, D.D.; Dunn, J.S.; Freeman, G.G.; Gillis, J.D.; Groves, R.A.; Hendersen, G.N.; Johnson, R.A.; Joseph, A.J.; Subbanna, S.; Victor, A.M.; Watson, K.M.; Webster, C.S.; Zampardi, P.J.

• Book ID: 114538906
• Publisher: IEEE
• Year: 2001
• Tongue: English
• Weight: 459 KB
• Volume: 48
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.960385