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Current problems in v.l.s.i. testing and testability : P. K. Lala. Radio Electron. Engr54 (10), 415 (1984)

Publisher: Elsevier Science
Year: 1985
Tongue: English
Weight: 127 KB
Volume: 25
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(85)90227-6

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Current problems in VLSI testing and tes

Current problems in VLSI testing and testability: Lala, P KRadio Electron. Eng. Vol 54 No 10 (October 1984) pp 415–423

📂 Article 📅 1984 🏛 Elsevier Science 🌐 English ⚖ 126 KB