Current problems in VLSI testing and testability: Lala, P KRadio Electron. Eng. Vol 54 No 10 (October 1984) pp 415–423

• Publisher: Elsevier Science
• Year: 1984
• Tongue: English
• Weight: 126 KB
• Volume: 8
• Category: Article
• ISSN: 0141-9331
• DOI: 10.1016/0141-9331(84)90077-2