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normal ageing trend is a stead), increase in resistance at a rate influenced by various factors such as manufacturing. origin, resistivity, electrical bias, environment, and encapsulation. The majority of the increases vary with the square-root of time, consistent with a diffusion-controlled degradation of the conduction processes. Some changes also conform to piezo-resistive effects and together these provide physical explanations for the ageing behaviour of thick-film resistors. The drift observed in the majority of resistors can be extrapolated to give a prediction of less than 0.5 percent change in 20 years operation in standard environments -a heartening prospect indeed for thick-film reliability.
Evaluation of Du Pont copper-compatible resistor system M V COLEMAN and G E GURNE'VI"
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for testability are discussed in detail. These include techniques which can be applied to today's tehnologies and techniques which have been recently introduced and will soon appear in new designs. ## 5. Discrete Devices On discrete hazard functions A. A. SALVIA and R. C. BOLLINGER IEEE Trans. Rel