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Current noise is thick and thin film resistors: S. Demolder, A. Van Calster and M. Van-Dendriessche Electrocomponent Sci. Technol. 19, 81 (1983)

Book ID
104157161
Publisher
Elsevier Science
Year
1984
Tongue
English
Weight
85 KB
Volume
15
Category
Article
ISSN
0026-2692

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Current noise is thick and thin film res
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for testability are discussed in detail. These include techniques which can be applied to today's tehnologies and techniques which have been recently introduced and will soon appear in new designs. ## 5. Discrete Devices On discrete hazard functions A. A. SALVIA and R. C. BOLLINGER IEEE Trans. Rel