Current-leakage failures in hybrid microcircuits : Richard C. Benson, Bruce M. Romenesko, Berry H. Nall, Newman Dehaas and Harry K. Charles Jr. IEEE Trans. Compon. Hybrids mfg Technol. CHMT-9 (4), 403 (1986)

• Publisher: Elsevier Science
• Year: 1987
• Tongue: English
• Weight: 126 KB
• Volume: 27
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(87)90878-x