✦ LIBER ✦
Metal electromigration induced by solder flux residue in hybrid microcircuits : Richard C. Benson, Bruce M. Romenesko, Joel A. Weiner, Berry H. Nall and Harry K. Charles Jr. IEEE Trans. Comp. Hybrids Manufact. Tech. 11(4), 363 (December 1988)
- Publisher
- Elsevier Science
- Year
- 1990
- Tongue
- English
- Weight
- 125 KB
- Volume
- 30
- Category
- Article
- ISSN
- 0026-2714
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