𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Current-Induced Degradation of Nickel Ohmic Contacts to SiC

✍ Scribed by B.P. Downey; J.R. Flemish; B.Z. Liu; T.E. Clark; S.E. Mohney


Book ID
107455333
Publisher
Springer US
Year
2009
Tongue
English
Weight
374 KB
Volume
38
Category
Article
ISSN
0361-5235

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Nickel Ohmic Contacts to N-Implanted (00
✍ M. Li; A. C. Ahyi; X. Zhu; Z. Chen; T. Isaacs-Smith; J. R. Williams; J. Crofton πŸ“‚ Article πŸ“… 2010 πŸ› Springer US 🌐 English βš– 279 KB
Nickel ohmic contacts to p- and n-type 4
✍ Fursin, L.G.; Zhao, J.H.; Weiner, M. πŸ“‚ Article πŸ“… 2001 πŸ› The Institution of Electrical Engineers 🌐 English βš– 233 KB
The Physics of Ohmic Contacts to SiC
✍ J. Crofton; L. M. Porter; J. R. Williams πŸ“‚ Article πŸ“… 1997 πŸ› John Wiley and Sons 🌐 English βš– 331 KB
Si/Pt Ohmic contacts to p-type 4H–SiC
✍ Papanicolaou, N. A.; Edwards, A.; Rao, M. V.; Anderson, W. T. πŸ“‚ Article πŸ“… 1998 πŸ› American Institute of Physics 🌐 English βš– 310 KB