Current crowding and misalignment effects as sources of error in contact resistivity measurements—Part II: Experimental results and computer simulation of self-aligned test structures

✍ Scribed by Cappelletti, P.; Finetti, M.; Scorzoni, A.; Suni, I.; Circelli, N.; Dalla Libera, G.

• Book ID: 114595912
• Publisher: IEEE
• Year: 1987
• Tongue: English
• Weight: 625 KB
• Volume: 34
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1987.22959