Current crowding and misalignment effects as sources of error in contact resistivity measurements—Part I: Computer simulation of conventional CER and CKR structures

✍ Scribed by Scorzoni, A.; Finetti, M.; Grahn, K.; Suni, I.; Cappelletti, P.

• Book ID: 114595911
• Publisher: IEEE
• Year: 1987
• Tongue: English
• Weight: 629 KB
• Volume: 34
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1987.22958