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Current conveyor based test structures for mixed-signal circuits

✍ Scribed by Hatzopoulos, A.A.; Siskos, S.; Laopoulos, T.

Book ID: 114447596
Publisher: The Institution of Electrical Engineers
Year: 1997
Tongue: English
Weight: 507 KB
Volume: 144
Category: Article
ISSN: 1350-2409
DOI: 10.1049/ip-cds:19971212

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