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A simple built-in current sensor for current monitoring in mixed-signal circuits

✍ Scribed by Siskos, S.; Hatzopoulos, A.A.


Book ID
114543914
Publisher
IEEE
Year
1997
Tongue
English
Weight
105 KB
Volume
46
Category
Article
ISSN
0018-9456

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## Abstract With respect to CMOS logic circuits, it is reported that a fault can occur cannot be covered by conventional classical fault model, and the current testing is considered to be interesting as a testing method to detect such a fault. This paper proposes a fault‐detection method for the C