Current Consumption and Power Integrity of CMOS Digital Circuits Under NBTI Wearout

✍ Scribed by J. M. Ruiz, R. Fernández-Garcia, I. Gil, M. Morata

• Book ID: 118800857
• Publisher: Springer US
• Year: 2012
• Tongue: English
• Weight: 419 KB
• Volume: 28
• Category: Article
• ISSN: 0923-8174
• DOI: 10.1007/s10836-012-5337-9