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Current Carrier Lifetimes Deduced from Hall Coefficient and Resistivity Measurements

โœ Scribed by Hunter, L. P.; Huibregtse, E. J.; Anderson, R. L.


Book ID
125487969
Publisher
The American Physical Society
Year
1953
Tongue
English
Weight
568 KB
Volume
91
Category
Article
ISSN
0031-899X

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A two-channel DC-SQUID voltmeter developed for the measurement of low-field Hall coefficient and electrical resistance of high-purity copper single crystals between 4.2 and 100 K is described. The noise is 1.8 pVHz -1/2 at 4.2 K and increases to 12 pVHz -1/2 at 100 K. A sample current up to 2.5 ร… an