𝔖 Bobbio Scriptorium

✦ LIBER ✦

Cumulative reference list of published books on microelectronics and reliability

Book ID: 103267816
Publisher: Elsevier Science
Year: 1970
Tongue: English
Weight: 966 KB
Volume: 9
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(70)90322-7

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📜 SIMILAR VOLUMES

Hints to Teachers and Students on the Ch

Hints to Teachers and Students on the Choice of Geographical Books for Reference and Reading; with Classified Lists

📂 Article 📅 1897 🏛 Nature Publishing Group 🌐 English ⚖ 120 KB

Book review:Influence of Temperature on

Book review:Influence of Temperature on Microelectronics and System Reliability, Pradeep Lall, Michael G. Pecht and Edward B. Hakim, CRC Press, 1997. Number of pages: 322

✍ P. D. T. O'Connor 📂 Article 📅 1998 🏛 John Wiley and Sons 🌐 English ⚖ 16 KB