✦ LIBER ✦
Book review:Influence of Temperature on Microelectronics and System Reliability, Pradeep Lall, Michael G. Pecht and Edward B. Hakim, CRC Press, 1997. Number of pages: 322
✍ Scribed by P. D. T. O'Connor
- Book ID
- 101292103
- Publisher
- John Wiley and Sons
- Year
- 1998
- Tongue
- English
- Weight
- 16 KB
- Volume
- 14
- Category
- Article
- ISSN
- 0748-8017
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