Property improvement of CuโZr alloy film
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Ying Wang; Fei Cao; Mi-lin Zhang; Tao Zhang
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Article
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2011
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Elsevier Science
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English
โ 798 KB
Films of Cu-Ru-Zr and Cu-Zr were deposited on SiO 2 /Si substrates by magnetron sputtering. Samples were subsequently annealed at temperatures of up to 500 ยฐC for 1 h and analyzed by four-point probe measurement, X-ray diffraction (XRD), transmission electron microscopy (TEM), X-ray photoelectron sp