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Cu(Ge) alloy films with zirconium addition on barrierless Si for excellent property improvement

โœ Scribed by Liu, B; Lin, L W; Ren, D; Zhang, Y P; Jiao, G H; Xu, K W


Book ID
125854692
Publisher
Institute of Physics
Year
2013
Tongue
English
Weight
965 KB
Volume
46
Category
Article
ISSN
0022-3727

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Films of Cu-Ru-Zr and Cu-Zr were deposited on SiO 2 /Si substrates by magnetron sputtering. Samples were subsequently annealed at temperatures of up to 500 ยฐC for 1 h and analyzed by four-point probe measurement, X-ray diffraction (XRD), transmission electron microscopy (TEM), X-ray photoelectron sp