X-ray powder diffraction measurements, at room temperature, and magnetic susceptibility c measurements, in the temperature range from 2 to 300 K, were made on polycrystalline samples of Cu 2 FeGeSe 4 and Cu 2 FeGeTe 4 magnetic semiconductor compounds. Magnetization measurements at 2, 4.2 and 77 K in
Crystallographic, Electrical and Magnetic Properties of the Cu2FeGeSe4 Compound
✍ Scribed by E. Quintero; R. Tovar; M. Quintero; G. Sánchez-Porras; P. Bocaranda; J.M. BrotoQuintero; H. Rakoto; R. Barbaste; J.C. Woolley; G. Lamarche; A.-M. Lamarche
- Publisher
- John Wiley and Sons
- Year
- 2000
- Tongue
- English
- Weight
- 111 KB
- Volume
- 220
- Category
- Article
- ISSN
- 0370-1972
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The electrical transport properties of a polycrystalline sample of Cu 2 FeGeSe 4 magnetic semiconductor compound are studied in the temperature range between 100 and 300 K. From the analysis of the electrical data, the values of the activation energy E A , the density of states effective mass of the
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