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Crystallinity of pure silica glass studied by positron annihilation

✍ Scribed by G. Brauer; G. Boden; A. Balogh; A. Andreeff


Book ID
104992529
Publisher
Springer
Year
1978
Tongue
English
Weight
229 KB
Volume
16
Category
Article
ISSN
1432-0630

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Study of defects in implanted silica gla
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Positron Annihilation Spectroscopy (PAS) performed with continuous and pulsed positron beams allows to characterize the size of the intrinsic nano-voids in silica glass, their in depth modification after ion implantation and their decoration by implanted ions. Three complementary PAS techniques, lif