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Crystalline structure of germanium films on silicon substrates: I. Investigation of the perfection of germanium heteroepitaxial films on silicon by X-ray diffraction methods

✍ Scribed by L.I. Datsenko; A.N. Gureev; N.F. Korotkevich; N.N. Soldatenko; Yu.A. Tkhorik

Publisher: Elsevier Science
Year: 1971
Tongue: English
Weight: 625 KB
Volume: 7
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(71)90030-7

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