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Crystalline quality and interface sharpness of ZnSe/ZnSxSe1-x superlattices on GaAs: analysis by Raman spectroscopy and X-ray diffractometry

✍ Scribed by J. Geurts; J. Woitok; J. Hermans; W. Schiffers; M. Scholl; J. Söllner; M. Heuken

No coin nor oath required. For personal study only.

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