𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Cryo-scanning electron microscopy and light microscopy for the study of fungi interactions

✍ Scribed by F. Sempere; M.P. Santamarina

Publisher
John Wiley and Sons
Year
2011
Tongue
English
Weight
479 KB
Volume
74
Category
Article
ISSN
1059-910X

No coin nor oath required. For personal study only.

✦ Synopsis

Abstract

The application of the cryo‐scanning electron microscopy and light microscopy for the study of the interactions at different environmental conditions between Penicillium oxalicum and Fusarium
verticillioides is described. A dual microculture was developed for the light microscopy analysis of the interaction. The microscope and macroscopic examinations were compared. Analysis of Petri plates revealed that F. verticillioides was a competitor for space and nutrients while P. oxalicum was a mycoparasite under the microscopic observations. Microsc. Res. Tech., 2010. Β© 2010 Wiley‐Liss, Inc.

πŸ“œ SIMILAR VOLUMES

A study of hydrogenated carbon fibers by
A study of hydrogenated carbon fibers by scanning electron microscopy and confocal laser scanning microscopy
✍ Antonio MadroΓ±ero De La Cal; Juan Aguado-Serrano; Maria Luisa Rojas-Cervantes; E πŸ“‚ Article πŸ“… 2009 πŸ› John Wiley and Sons 🌐 English βš– 349 KB

## Abstract The hydrogen absorption process is studied in carbonaceous fibers produced from a mixture of methane and hydrogen. The absorption of the hydrogen was examined in two types of fibers, in β€œas‐grown” state and after a process of desorption during an annealing to 1.473 K under vacuum. Later

Reflected Electron Energy-loss Microscop
Reflected Electron Energy-loss Microscopy and Scanning Auger Microscopy Study of Semiconductor Surfaces
✍ Paparazzo, E. πŸ“‚ Article πŸ“… 1997 πŸ› John Wiley and Sons 🌐 English βš– 495 KB πŸ‘ 2 views

The diagnostic potential of reΓ‘ected electron energy-loss microscopy (REELM) and scanning Auger microscopy (SAM) are explored with respect to two particular aspects encountered in the surface microchemical analysis of semiconductor materials : determining the kind of coverage, i.e. whether continuou