The diagnostic potential of reΓected electron energy-loss microscopy (REELM) and scanning Auger microscopy (SAM) are explored with respect to two particular aspects encountered in the surface microchemical analysis of semiconductor materials : determining the kind of coverage, i.e. whether continuou
A scanning electron microscopy morphometric study of the rabbit peritoneal surface
β Scribed by Gaudio, Eugenio ;Casale, Nicoletta ;Pannarale, Luigi ;Priori, Alberto ;Marinozzi, Giulio
- Publisher
- John Wiley and Sons
- Year
- 1990
- Tongue
- English
- Weight
- 830 KB
- Volume
- 228
- Category
- Article
- ISSN
- 0003-276X
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