✦ LIBER ✦

Crosstalk effect in electron beam testing: Simulations and measurements

✍ Scribed by M. Schöttler; C. Traub; E. Kubalek

Publisher: Elsevier Science
Year: 1994
Tongue: English
Weight: 657 KB
Volume: 24
Category: Article
ISSN: 0167-9317
DOI: 10.1016/0167-9317(94)90075-2

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

The influence of primary background and

The influence of primary background and primary crosstalk upon electron beam testing

✍ R. Hamerlik 📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 534 KB

Simulating electron cloud effects in hea

Simulating electron cloud effects in heavy-ion beams

✍ R.H. Cohen; A. Friedman; S.M. Lund; A.W. Molvik; T. Azevedo; J.-L. Vay; P. Stolt 📂 Article 📅 2005 🏛 Elsevier Science 🌐 English ⚖ 400 KB

Timing diagram: A new electron-beam test

Timing diagram: A new electron-beam test technique for linking IC-internal measurements to simulation

✍ Hermann Harbeck; Roland Reinl; Peter Keβler; Siegfried Görlich 📂 Article 📅 1990 🏛 Elsevier Science 🌐 English ⚖ 543 KB

Advances on proximity effect measurement

Advances on proximity effect measurement and correction in electron beam lithography

✍ B. Dal'zotto; H. Dugourd; M. Lerme; F. Méot 📂 Article 📅 1985 🏛 Elsevier Science 🌐 English ⚖ 345 KB

Application of electron-beam testing tec

Application of electron-beam testing technique to potential profile measurements in thin film semiconductor devices

✍ A. Jank; M. Jung; H. Schmoranzer 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 642 KB

Fast electron beam simulation and dose c

Fast electron beam simulation and dose calculation in radiotherapy

✍ A. Trindade; P. Rodrigues; L. Peralta; M.C. Lopes; C. Alves; A. Chaves 📂 Article 📅 2004 🏛 Elsevier Science 🌐 English ⚖ 588 KB

A flexible multiple source model capable of fast reconstruction of clinical electron beams is presented in this paper. A source model considers multiple virtual sources emulating the effect of the accelerator head components. A reference configuration (10 MeV and 10 Â 10 cm 2 field size) for a Sieme