Cross-sectional atomic force imaging of semiconductor heterostructures
โ Scribed by B. Dwir; F. Reinhardt; G. Biasiol; E. Kapon
- Publisher
- Elsevier Science
- Year
- 1996
- Tongue
- English
- Weight
- 712 KB
- Volume
- 37
- Category
- Article
- ISSN
- 0921-5107
No coin nor oath required. For personal study only.
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