## Abstract The technique which is described combines the advantages of the techniques formerly proposed in the literature in each stage of the preparation of transmission electron microscopy (TEM) specimens including a single metal‐ceramic interface. It allows easy handling of the thin foils in sp
Cross-section preparation for transmission electron microscopy of phases and interfaces in C/BN heterostructures
✍ Scribed by B. Reznik; S. Kalhöfer
- Book ID
- 108480867
- Publisher
- Elsevier Science
- Year
- 2002
- Tongue
- English
- Weight
- 809 KB
- Volume
- 33
- Category
- Article
- ISSN
- 0968-4328
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Thin film specimen preparation from bulk material a t a controlled depth below the surface and cross-section thin film preparation for transmission electron microscope investigations of electrically conducting materials are described. Both techniques are illustrated by austenitic stainless steel, wh
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