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Critical thickness in strained-layer GaInAs/GaAs quantum well lasers

✍ Scribed by Mantz, J.; Shieh, C.; Lee, H.; Ackley, D.; Engelmann, R.


Book ID
120256560
Publisher
The Institution of Electrical Engineers
Year
1989
Tongue
English
Weight
292 KB
Volume
25
Category
Article
ISSN
0013-5194

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