𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Critical thickness for cracking of Pb(Zr0.53Ti0.47)O3 thin films deposited on Pt/Ti/Si(100) substrates

✍ Scribed by M.-H. Zhao; R. Fu; D. Lu; T.-Y. Zhang

Book ID
108491917
Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
269 KB
Volume
50
Category
Article
ISSN
1359-6454

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Optical properties of Pb(Zr0.53Ti0.47)O3
Optical properties of Pb(Zr0.53Ti0.47)O3 thin films on Pt-coated Si substrates measured by spectroscopic ellipsometry in the UV–vis–NIR region
✍ Y.P. Jiang; X.G. Tang; Q.X. Liu; Q. Li; A.L. Ding πŸ“‚ Article πŸ“… 2007 πŸ› Elsevier Science 🌐 English βš– 740 KB

Pb(Zr 0.53 Ti 0.47 )O 3 (PZT) thin films grown on Pt-coated Si substrates were prepared by a sol-gel process. Crystalline structure characterisation and optical constants (refractive index n, extinction coefficient k) and bandgaps E g of PZT thin films annealed at 550, 600 and 650 β€’ C were obtained