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Critical thickness determination of InAs, InP and GaP on GaAs by X-ray interference effect and transmission electron microscopy

✍ Scribed by A. Mazuelas; L. González; F.A. Ponce; L. Tapfer; F. Briones


Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
555 KB
Volume
131
Category
Article
ISSN
0022-0248

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