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Critical layer thickness for misfit dislocation stability in multilayer structures

✍ Scribed by Hirth, J. P.; Feng, Xiaoxin


Book ID
120313344
Publisher
American Institute of Physics
Year
1990
Tongue
English
Weight
909 KB
Volume
67
Category
Article
ISSN
0021-8979

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Kinetic critical thickness for surface w
✍ D.D. PerovicΒ΄; B. Bahierathan; H. Lafontaine; D.C. Houghton; D.W. McComb πŸ“‚ Article πŸ“… 1997 πŸ› Elsevier Science 🌐 English βš– 539 KB

The kinetic critical thicknesses for surface wave formation and misfit dislocation generation in UHVCVD-grown GeSi/Si have been quantitatively determined using microscopical techniques. A refined morphological instability theory has been developed using a coupled continuum/atomistic treatment that i