Atomic force acoustic microscopy is an interesting measurement technique for characterization and mapping of local elastic properties of different materials, taking advantage of high lateral resolutions typical of scanning probe instruments. The present work discusses applicability of the technique
Critical factors in quantitative Atomic Force Acoustic Microscopy
β Scribed by F. Marinello; P. Schiavuta; S. Carmignato; E. Savio
- Publisher
- Elsevier
- Year
- 2010
- Tongue
- English
- Weight
- 286 KB
- Volume
- 3
- Category
- Article
- ISSN
- 1755-5817
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