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Criterion for normalizing reliability and repairability indexes of electronic medical devices

✍ Scribed by A. I. Vladov; Yu. F. Kabatov

Publisher: Springer US
Year: 1968
Tongue: English
Weight: 402 KB
Volume: 2
Category: Article
ISSN: 0006-3398
DOI: 10.1007/bf00561201

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