𝔖 Bobbio Scriptorium

✦ LIBER ✦

Criteria of low-noise thick-film resistors : L. K. J. Vandamme. Electrocomp. Sci. Technol. 4, 171 (1977)

Publisher: Elsevier Science
Year: 1978
Tongue: English
Weight: 119 KB
Volume: 17
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(78)91095-8

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Techniques for the examination of thick

Techniques for the examination of thick film resistor microstructures by TEM : D. J. Pedder. Electrocomp. Sci. Technol.4, 85 (1977)

📂 Article 📅 1978 🏛 Elsevier Science 🌐 English ⚖ 261 KB

Low frequency characteristics of TiO2 (r

Low frequency characteristics of TiO2 (rutile)-glass thick films : B. Liczerski and K. Nitsch. Electrocomp. Sci. Technol.4, 1 (1977)

📂 Article 📅 1978 🏛 Elsevier Science 🌐 English ⚖ 131 KB

Factors affecting laser-trim stability o

Factors affecting laser-trim stability of thick film resistors : R. E. Cote, R. C. Headley, J. T. Herman and A. Howe. Electrocomp. Sci. Technol. 4, 193 (1977)

📂 Article 📅 1978 🏛 Elsevier Science 🌐 English ⚖ 125 KB