✦ LIBER ✦
Techniques for the examination of thick film resistor microstructures by TEM : D. J. Pedder. Electrocomp. Sci. Technol.4, 85 (1977)
- Publisher
- Elsevier Science
- Year
- 1978
- Tongue
- English
- Weight
- 261 KB
- Volume
- 17
- Category
- Article
- ISSN
- 0026-2714
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