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Crack tip dislocation emission and nanoscale deformation fields in silicon

✍ Scribed by C. W. Zhao; Y. M. Xing; P. C. Bai; J. J. Li; Q. L. Liu; Y. G. Du; M. H. Liu

Publisher
Springer
Year
2011
Tongue
English
Weight
509 KB
Volume
105
Category
Article
ISSN
1432-0630

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