๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Coupled Monte Carlo-drift diffusion analysis of hot-electron effects in MOSFETs

โœ Scribed by Higman, J.M.; Hess, K.; Hwang, C.G.; Dutton, R.W.


Book ID
114535820
Publisher
IEEE
Year
1989
Tongue
English
Weight
929 KB
Volume
36
Category
Article
ISSN
0018-9383

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES