✦ LIBER ✦
Modeling hot-electron gate current in Si MOSFET's using a coupled drift-diffusion and Monte Carlo method
✍ Scribed by Chimoon Huang; Tahui Wang; Chen, C.N.; Chang, M.C.; Fu, J.
- Book ID
- 114534862
- Publisher
- IEEE
- Year
- 1992
- Tongue
- English
- Weight
- 682 KB
- Volume
- 39
- Category
- Article
- ISSN
- 0018-9383
No coin nor oath required. For personal study only.